Dehm, G Max Planck Society;
Clemens, H. Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Schillinger, W., Zhang, D., Dehm, G., & Clemens, H. (2001). Creep behavior and microstructural stability of lamellar γ-TiAl (Cr, Mo, Si, B) with extremely fine lamellar spacing. In J. H. Schneidel, K. J. Hemker, R. D. Noebe, S. Hanada, & G. Sauthoff (Eds.), High-Temperature Ordered Intermetallic Alloys IX (pp. N1.4.1.-N1.4.6.). Warrendale, PA: MRS.