In-situ transmission electron microscopy study of dislocations in a 
polycrystalline Cu thin film constrained by a substrate

Dehm, G.; Arzt, E.

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In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate

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Dehm, G.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt, E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Dehm, G., & Arzt, E. (2000). In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. Applied Physics Letters, 77(8), 1126-1128.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3778-F

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