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Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions

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Kohler-Redlich,  P.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bäder,  U.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Heiland,  B.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Spolenak,  R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Rühle,  M.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Wei, B.-Q., Kohler-Redlich, P., Bäder, U., Heiland, B., Spolenak, R., Arzt, E., et al. (2000). Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions. Ultramicroscopy, 85, 93-98.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-385E-3
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