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X-Ray diffraction analysis of stacking and twin faults in fcc metals: A revision and allowance for texture and non-uniform fault probabilities

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Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Velterop, L., Delhez, R., de Keijser, T. H., Mittemeijer, E. J., & Reefmann, D. (2000). X-Ray diffraction analysis of stacking and twin faults in fcc metals: A revision and allowance for texture and non-uniform fault probabilities. Journal of Applied Physics, 33, 296-306.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3925-A
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