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A tool for X-ray diffraction analysis of thin layers on substrates: Substrate peak removal method

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Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Citation

Kamminga, J.-D., Delhez, R., de Keijser, T. H., & Mittemeijer, E. J. (2000). A tool for X-ray diffraction analysis of thin layers on substrates: Substrate peak removal method. Journal of Applied Crystallography, 33, 108-111.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-394F-E
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