Mittemeijer, E. J. Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society; Universität Stuttgart, Institut für Materialwissenschaft;
Kamminga, J.-D., Delhez, R., de Keijser, T. H., & Mittemeijer, E. J. (2000). A tool for X-ray diffraction analysis of thin layers on substrates: Substrate peak removal method. Journal of Applied Crystallography, 33, 108-111.
