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Strain profiles in epitaxial films from X-ray Bragg diffraction phases

MPS-Authors
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Ern,  C.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Donner,  W.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Dosch,  H.
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Theoretische und Angewandte Physik;

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Citation

Vartanyants, I., Ern, C., Donner, W., Dosch, H., & Caliebe, W. (2000). Strain profiles in epitaxial films from X-ray Bragg diffraction phases. Applied Physics Letters, 77, 3929-3931.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3995-C
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