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X-ray diffraction as a tool to study the mechanical behaviour of thin films

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Kraft,  O.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hommel,  M.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt,  E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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Kraft, O., Hommel, M., & Arzt, E. (2000). X-ray diffraction as a tool to study the mechanical behaviour of thin films. Materials Science and Engineering A, 288, 209-216.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-39DE-A
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