Characterization of ytterbium silicide formed in ultra high vacuum

Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.

doi:10.1088/1742-6596/209/1/012056

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Characterization of ytterbium silicide formed in ultra high vacuum

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Srot, V.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp, F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Łaszcz, A., Ratajczak, J., Czerwinski, A., Kątcki, J., Srot, V., Phillipp, F., van Aken, P. A., Yarekha, D., Reckinger, N., Larrieu, G., & Dubois, E. (2010). Characterization of ytterbium silicide formed in ultra high vacuum. Journal of Physics: Conference Series, 209:.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-3B75-4

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