Grain-boundary types in chalcopyrite-type thin films and their correlations 
with film texture and electrical properties

Abou-Ras, D.; Koch, C. T.; Küstner, V.; van Aken, P. A.; Jahn, U.; Contreras, M. A.; Caballero, R.; Kaufmann, C. A.; Scheer, R.; Unold, T.; Schock, H.-W.

doi:10.1016/j.tsf.2008.11.044

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Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties

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Koch, C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Küstner, V.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Abou-Ras, D., Koch, C. T., Küstner, V., van Aken, P. A., Jahn, U., Contreras, M. A., Caballero, R., Kaufmann, C. A., Scheer, R., Unold, T., & Schock, H.-W. (2009). Grain-boundary types in chalcopyrite-type thin films and their correlations with film texture and electrical properties. Thin Solid Films, 517, 2545-2549. doi:10.1016/j.tsf.2008.11.044.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-3D5E-E

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