Various transmission electron microscopic techniques to characterize phase 
separation – illustrated using a LaF3 containing aluminosilicate glass

Bhattacharyya, S.; Höche, T.; Hahn, K.; van Aken, P. A.

doi:10.1016/j.jnoncrysol.2008.12.005

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Various transmission electron microscopic techniques to characterize phase separation – illustrated using a LaF₃ containing aluminosilicate glass

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Bhattacharyya, S.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Hahn, K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Bhattacharyya, S., Höche, T., Hahn, K., & van Aken, P. A. (2009). Various transmission electron microscopic techniques to characterize phase separation – illustrated using a LaF₃ containing aluminosilicate glass. Journal of Non-Crystalline Solids, 355, 393-396. doi:10.1016/j.jnoncrysol.2008.12.005.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3DAC-F

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