Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe4N1-x
 layer on an α-Fe substrate measured by X-ray diffraction stress analysis at 
constant information depth

Wohlschlögel, M.; Welzel, U.; Mittemeijer, E. J.

doi:10.1557/JMR.2009.0153

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Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe₄N_1-x layer on an α-Fe substrate measured by X-ray diffraction stress analysis at constant information depth

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Wohlschlögel, M.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Welzel, U.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Mittemeijer, E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Wohlschlögel, M., Welzel, U., & Mittemeijer, E. J. (2009). Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe₄N_1-x layer on an α-Fe substrate measured by X-ray diffraction stress analysis at constant information depth. Journal of Materials Research, 24, 1342-1352. doi:10.1557/JMR.2009.0153.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3DD2-8

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