EFTEM tomography on nanomaterials

Jin-Phillipp, N. Y.; Koch, C. T.; van Aken, P. A.

doi:10.3217/978-3-85125-062-6-035

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EFTEM tomography on nanomaterials

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Jin-Phillipp, N. Y.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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引用

Jin-Phillipp, N. Y., Koch, C. T., & van Aken, P. A. (2009). EFTEM tomography on nanomaterials. In G., Kothleitner, & M., Leisch (Eds.), MC2009. Vol. 1: Instrumentation and Methodology (pp. 73-74). Graz: Verlag der Technischen Universität Graz, Austria.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-3E13-C

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