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Surface plasmon resonance effects in a perforated Ag film studied by energy-filtering TEM

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Nelayah,  J.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Ögüt,  B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Sigle, W., Nelayah, J., Koch, C. T., Ögüt, B., & van Aken, P. A. (2009). Surface plasmon resonance effects in a perforated Ag film studied by energy-filtering TEM. In G. Kothleitner, & M. Leisch (Eds.), MC2009. Vol. 1: Instrumentation and Methodology (pp. 111-112). Graz: Verlag der Technischen Universität Graz, Austria.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-3E15-8
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