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Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements.

MPS-Authors
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Kuru,  Y.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wohlschlögel,  M.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Welzel,  U.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Kuru, Y., Wohlschlögel, M., Welzel, U., & Mittemeijer, E. J. (2009). Grain growth in nanocrystalline copper thin films investigated by non-ambient X-ray diffraction measurements. Powder Diffraction, 24, 85-88. doi:10.1154/1.3125550.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-3E80-7
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