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Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM

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Höschen,  R.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Haider, M., Müller, H., Uhlemann, S., J. Zach, J., Löbau, U., & Höschen, R. (2008). Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM. Ultramicroscopy, 108, 167-178.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4045-D
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