Preparation of SiC/SiC thin foils for TEM observations by wedge polishing method

Gec, M.; Toplišek, T.; Srot, V.; Dražić, G.; Kobe, S.; van Aken, P. A.; Čeh, M.

doi:10.1007/978-3-540-85226-1_409

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Preparation of SiC/SiC thin foils for TEM observations by wedge polishing method

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Srot, V.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken, P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gec, M., Toplišek, T., Srot, V., Dražić, G., Kobe, S., van Aken, P. A., & Čeh, M. (2008). Preparation of SiC/SiC thin foils for TEM observations by wedge polishing method. In M., Luysberg, K., Tillmann, & T., Weirich (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods (pp. 817-818). Berlin [et al.]: Springer.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-40F4-3

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