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Analytical and high-resolution TEM investigation of boron-doped CeO2

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Rahmati,  B.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

Gregori,  G.
Max Planck Society;

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Sigle,  W.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75691

Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

Maier,  J.
Max Planck Society;

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Citation

Rahmati, B., Gregori, G., Sigle, W., Koch, C. T., van Aken, P. A., & Maier, J. (2008). Analytical and high-resolution TEM investigation of boron-doped CeO2. In S. Richter, & A. Schwedt (Eds.), EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science (pp. 565-566). Berlin [et al.]: Springer.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4100-0
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