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In-situ X-ray diffraction investigations of thin films: determination of thermoelastic constants.

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Kuru,  Y.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wohlschlögel,  M.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Welzel,  U.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Mittemeijer,  E. J.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Materialwissenschaft;

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Citation

Kuru, Y., Wohlschlögel, M., Welzel, U., & Mittemeijer, E. J. (2008). In-situ X-ray diffraction investigations of thin films: determination of thermoelastic constants. Zeitschrift für Kristallographie, Suppl., 27, 253-260.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-41A8-5
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