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Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs

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Du,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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von Hochmeister,  K.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Du, K., von Hochmeister, K., & Phillipp, F. (2007). Quantitative comparison of image contrast and pattern between experimental and simulated high-resolution transmission electron micrographs. Ultramicroscopy, 107, 281-292.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4345-F
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