English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Journal Article

Analysis of results from X-ray magnetic reflectometry for magnetic multilayer systems

MPS-Authors
/persons/resource/persons75455

Fähnle,  M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76151

Steiauf,  D.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75831

Martosiswoyo,  L.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75502

Goering,  E.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75325

Brück,  S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76085

Schütz,  G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Fähnle, M., Steiauf, D., Martosiswoyo, L., Goering, E., Brück, S., & Schütz, G. (2007). Analysis of results from X-ray magnetic reflectometry for magnetic multilayer systems. Physical Review B, 75: 144415.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4351-4
Abstract
There is no abstract available