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Analysis of results from X-ray magnetic reflectometry for magnetic multilayer systems

MPS-Authors
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Fähnle,  M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Steiauf,  D.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Martosiswoyo,  L.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Goering,  E.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Brück,  S.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz,  G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Fähnle, M., Steiauf, D., Martosiswoyo, L., Goering, E., Brück, S., & Schütz, G. (2007). Analysis of results from X-ray magnetic reflectometry for magnetic multilayer systems. Physical Review B, 75: 144415.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4351-4
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