English
 
User Manual Privacy Policy Disclaimer Contact us
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT

Released

Conference Paper

Mapping grain boundary potentials by inline electron holography

MPS-Authors
/persons/resource/persons75691

Koch,  C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons75971

Rahmati,  B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76219

van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

/persons/resource/persons76016

Rühle,  M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Ressource
No external resources are shared
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Koch, C. T., Rahmati, B., van Aken, P. A., Rühle, M., Bäurer, M., & Hoffmann, M. (2007). Mapping grain boundary potentials by inline electron holography. Microscopy & Microanalysis, 13(Suppl. 3), 334-335.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-4438-5
Abstract
There is no abstract available