Length-scale-controlled fatigue mechanisms in thin copper films

Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Wellner, P.; Arzt, E.

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Length-scale-controlled fatigue mechanisms in thin copper films

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Zhang, G. P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Volkert, C. A.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schwaiger, R.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wellner, P.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Arzt, E.
Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;
Universität Stuttgart, Institut für Metallkunde;

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引用

Zhang, G. P., Volkert, C. A., Schwaiger, R., Wellner, P., & Arzt, E. (2006). Length-scale-controlled fatigue mechanisms in thin copper films. Acta Materialia, 54, 3127-3139.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-45E6-6

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