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In-situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon

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Lee,  S. B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Phillipp,  F.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Lee, S. B., Choi, D.-K., Phillipp, F., Jeon, K.-S., & Kim, C. K. (2006). In-situ high-resolution transmission electron microscopy study of interfacial reactions of Cu thin films on amorphous silicon. Applied Physics Letters, 88: 083117.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-46AF-B
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