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Requisites for ultimate energy resolution EELS and band gap measurements in TEM

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Höschen,  R.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Essers, E., Höschen, R., Matijevic, M., Benner, G., & Koch, C. T. (2006). Requisites for ultimate energy resolution EELS and band gap measurements in TEM. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 810-810). International Federation of Societies in Microscopy.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-47DB-0
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