Diffraction tomography and its application to integranular glassy films in 
ceramics

Koch, C. T.; Bhattacharyya, S.; Rühle, M.

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Diffraction tomography and its application to integranular glassy films in ceramics

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Koch, C. T.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Rühle, M.
Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch, C. T., Bhattacharyya, S., & Rühle, M. (2006). Diffraction tomography and its application to integranular glassy films in ceramics. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 999-999). International Federation of Societies in Microscopy.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-47E3-B

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