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AES depth profiling and interface analysis of C/Ta bilayers

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Hofmann,  S.
Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Zalar, A., Kovac, J., Pracek, B., Hofmann, S., & Panjan, P. (2005). AES depth profiling and interface analysis of C/Ta bilayers. Applied Surface Science, 252(5), 2056-2062.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-48B6-9
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