Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray 
reflectometry

Geissler, J.; Goering, E.; Justen, M.; Weigand, F.; Schütz, G.; Langer, J.; Schmitz, D.; Maletta, H.; Mattheis, R.

doi:10.1103/PhysRevB.65.020405

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Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray reflectometry

MPS-Authors

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Geissler, J.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Goering, E.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Weigand, F.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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引用

Geissler, J., Goering, E., Justen, M., Weigand, F., Schütz, G., Langer, J., Schmitz, D., Maletta, H., & Mattheis, R. (2002). Pt magnetization profile in a Pt/Co bilayer studied by resonant magnetic x-ray reflectometry. Physical Review B, 65:. doi:10.1103/PhysRevB.65.020405.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-49DA-4

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