Element-specific imaging of magnetic domains at 25 nm spatial Resolution using 
soft X-ray microscopy

Fischer, P.; Eimüller, T.; Schütz, G.; Denbeaux, G.; Pearson, A.; Johnson, L.; Attwood, D.; Tsunashima, S.; Kumazawa, M.; Takagi, N.; Köhler, M.; Bayreuther, G.

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Element-specific imaging of magnetic domains at 25 nm spatial Resolution using soft X-ray microscopy

MPS-Authors

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Fischer, P.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Eimüller, T.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Schütz, G.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Fischer, P., Eimüller, T., Schütz, G., Denbeaux, G., Pearson, A., Johnson, L., et al. (2001). Element-specific imaging of magnetic domains at 25 nm spatial Resolution using soft X-ray microscopy. Review of Scientific Instruments, 72, 2322-2324.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-49F4-8

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