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Accurate dosimetry in scanning transmission X-ray microscopes via the cross-linking threshold dose of poly(methyl methacrylate)

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Weigand,  M.
Dept. Modern Magnetic Systems, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Wang,  J.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Leontowich, A. F. G., Hitchcock, A. P., Tyliszczak, T., Weigand, M., Wang, J., & Karunakaran, C. (2012). Accurate dosimetry in scanning transmission X-ray microscopes via the cross-linking threshold dose of poly(methyl methacrylate). Journal of Synchrotron Radiation, 19(6), 976-987. doi:10.1107/s0909049512034486.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4BB0-3
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