Characterization of strained semiconductor structures using transmission 
electron microscopy

Özdöl, V. B.

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Characterization of strained semiconductor structures using transmission electron microscopy

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Özdöl, V. B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Özdöl, V. B. (2011). Characterization of strained semiconductor structures using transmission electron microscopy. PhD Thesis, Christian-Abrechts-Universität zu Kiel, Kiel.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4C83-1

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