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Conference Paper

Low-dose strain mapping by dark-field inline electron holography

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Özdöl,  V. B.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Koch,  C. T.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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van Aken,  P. A.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Özdöl, V. B., Koch, C. T., & van Aken, P. A. (2011). Low-dose strain mapping by dark-field inline electron holography. Microscopy and Microanalysis, 17, Suppl. 2, 1228-1229.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4F10-B
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