Quantitative X-ray diffraction analysis and modeling of the crystallization 
process in amorphous Si-B-C-N polymer derived ceramics

Tavakoli, A. H.; Gerstel, P.; Golczewski, J. A.; Bill, J.

doi:10.1111/j.1551-2916.2009.03591.x

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Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics

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Tavakoli, A. H.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Gerstel, P.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Golczewski, J. A.
Former Dept. Materials Synthesis and Microstructure Design, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Tavakoli, A. H., Gerstel, P., Golczewski, J. A., & Bill, J. (2010). Quantitative X-ray diffraction analysis and modeling of the crystallization process in amorphous Si-B-C-N polymer derived ceramics. Journal of the American Ceramic Society, 93, 1470-1478. doi:10.1111/j.1551-2916.2009.03591.x.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0010-4F6B-1

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