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Enhanced atomic corrugation in dynamic force microscopy - The role of repulsive forces

MPS-Authors
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Lichtenstein,  Leonid
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Büchner,  Christin
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Stuckenholz,  Stefanie
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Heyde,  Markus
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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1.3696039.pdf
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Citation

Lichtenstein, L., Büchner, C., Stuckenholz, S., Heyde, M., & Freund, H.-J. (2012). Enhanced atomic corrugation in dynamic force microscopy - The role of repulsive forces. Applied Physics Letters, 100(12): 123105. doi:10.1063/1.3696039.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-50DA-F
Abstract
Full range two dimensional (2D) force mapping was performed by means of low temperature dynamic force microscopy (DFM) on a highly complex surface structure. For this purpose, we used a thin film of vitreous silica on a Ru(0001)-support, which is a 2D structural equivalent to silica glass. The 2D spectroscopy shows that the contrast generating shift in vertical distance between two sites on the surface is twice as large on the repulsive branch of the frequency shift-distance curve as compared to the attractive branch. The results give insight into the origin of the formation of atomic resolution in DFM.