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Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy

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Huber,  A. J.
Baumeister, Wolfgang / Molecular Structural Biology, Max Planck Institute of Biochemistry, Max Planck Society;

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Ziegler,  A.
Baumeister, Wolfgang / Molecular Structural Biology, Max Planck Institute of Biochemistry, Max Planck Society;

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Hillenbrand,  R.
Baumeister, Wolfgang / Molecular Structural Biology, Max Planck Institute of Biochemistry, Max Planck Society;

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Citation

Gigler, A. M., Huber, A. J., Bauer, M., Ziegler, A., Hillenbrand, R., & Stark, R. W. (2009). Nanoscale residual stress-field mapping around nanoindents in SiC by IR s-SNOM and confocal Raman microscopy. Optics Express, 17(25), 22351-22357.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-5831-3
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