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Towards SNIM: Scanning Near-field Microscopy in the Infrared

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Keilmann, F. (1996). Towards SNIM: Scanning Near-field Microscopy in the Infrared. In Garcia, M. Nieto-Vesperinas, & N. (Eds.), Optics at the Nanometer Scale (pp. 235-245). IBM, Netherlands.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0010-731F-1
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