Comparative-study of a regular protein layer by scanning tunneling microscopy 
and transmission electron-microscopy

Amrein, M.; Wang, Z.; Guckenberger, R.

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Comparative-study of a regular protein layer by scanning tunneling microscopy and transmission electron-microscopy

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Amrein, M., Wang, Z., & Guckenberger, R. (1991). Comparative-study of a regular protein layer by scanning tunneling microscopy and transmission electron-microscopy. Journal of Vacuum Science & Technology B-Microelectronics Processing and Phenomena, 9(N2), 1276-1281.

引用: https://hdl.handle.net/11858/00-001M-0000-0010-7431-B