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In-situ atomic resolution high-voltage electron microscopy

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Phillipp,  F.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Lee,  S. B.
Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Citation

Phillipp, F., Lee, S. B., & Merkle, K. L. (2004). In-situ atomic resolution high-voltage electron microscopy. In Proceedings of the 8th Asia-Pacific Conference on Electron Microscopy (8APEM) (pp. 653-654). Japanese Society for Electron Microscopy.


Cite as: https://hdl.handle.net/11858/00-001M-0000-000E-8037-8
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