Alignment of Transmission-Electron-Microscopy Images Aqcuired During a 
Tilt-Series by Tracking Fiducial Markers

Stockmeier, K

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Alignment of Transmission-Electron-Microscopy Images Aqcuired During a Tilt-Series by Tracking Fiducial Markers

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Stockmeier, K. (2000). Alignment of Transmission-Electron-Microscopy Images Aqcuired During a Tilt-Series by Tracking Fiducial Markers. Diploma Thesis, Hochschule Ludwigshafen, Ludwigshafen, Germany.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0013-E42A-5

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