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TEM foil preparation of sub-micrometre sized individual grains by focused ion beam technique

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Vollmer,  C.
Particle Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Hoppe,  P.
Particle Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Holzapfel, C., Soldera, F., Vollmer, C., Hoppe, P., & Mücklich, F. (2009). TEM foil preparation of sub-micrometre sized individual grains by focused ion beam technique. Journal of Microscopy-Oxford, 235(1), 59-66.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0014-829C-8
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