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Isotopic metrology of carbon dioxide. II. Effects of ion source materials, conductance, emission, and accelerating voltage on dual-inlet cross contamination

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Assonov,  S.
Atmospheric Chemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Verkouteren, R. M., Assonov, S., Klinedinst, D. B., & Brand, W. A. (2003). Isotopic metrology of carbon dioxide. II. Effects of ion source materials, conductance, emission, and accelerating voltage on dual-inlet cross contamination. Rapid Communications in Mass Spectrometry, 17(8), 777-782.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0014-8F5A-3
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