Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass 
reference materials by means of synchrotron micro-XRF

Kempenaers, L.; Janssens, K.; Jochum, K. P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F.

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Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF

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Jochum, K. P.
Geochemistry, Max Planck Institute for Chemistry, Max Planck Society;

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Kempenaers, L., Janssens, K., Jochum, K. P., Vincze, L., Vekemans, B., Somogyi, A., et al. (2003). Micro-heterogeneity study of trace elements in USGS, MPI-DING and NIST glass reference materials by means of synchrotron micro-XRF. Journal of Analytical Atomic Spectrometry, 18(4), 350-357.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0014-8F5C-0

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