Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface 
Structures and Surface Solvation

Campen, Kramer

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Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface Structures and Surface Solvation

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Campen, Kramer
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

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Campen, K. (2013). Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface Structures and Surface Solvation. Talk presented at Integrated Research Training Group Seminar on Elementary Processes in Molecular Switches: Collaborative Research Center 658, Technische Universität. Berlin, Germany. 2013-03.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0014-56C3-4

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