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Journal Article

Patterned Defect Structures Predicted for Graphene Are Observed on Single-Layer Silica Films

MPS-Authors
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Yang,  Bing
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Boscoboinik,  Jorge Anibal
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Yu,  Xin
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Shaikhutdinov,  Shamil K.
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Freund,  Hans-Joachim
Chemical Physics, Fritz Haber Institute, Max Planck Society;

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Citation

Yang, B., Boscoboinik, J. A., Yu, X., Shaikhutdinov, S. K., & Freund, H.-J. (2013). Patterned Defect Structures Predicted for Graphene Are Observed on Single-Layer Silica Films. Nano Letters, 13(9), 4422-4427. doi:10.1021/nl402264k.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0014-6222-7
Abstract
Topological defects in two-dimensional materials such as graphene are considered as a tool for tailoring their physical properties. Here, we studied defect structures on a single-layer silica (silicatene) supported on Ru(0001) using a low energy electron diffraction, scanning tunneling microscopy, infrared reflection–absorption spectroscopy, and photoelectron spectroscopy. The results revealed easy formation of periodic defect structures, which were previously predicted for graphene on a theoretical ground, yet experimentally unrealized. The structural similarities between single-layer materials (graphene, silicene, silicatene) open a new playground for deeper understanding and tailoring structural, electronic, and chemical properties of the truly two-dimensional systems.