English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
Add to Basket
  Local TagsRelease HistoryDetailsSummary

Released
Journal Article

Influence of line defects on the electrical properties of single crystal TiO2

MPS-Authors
/persons/resource/persons75666

Kelsch,  M.
Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)
There are no public fulltexts stored in PuRe
Supplementary Material (public)
There is no public supplementary material available
Citation

Adepalli, K. K., Kelsch, M., Merkle, R., & Maier, J. (2013). Influence of line defects on the electrical properties of single crystal TiO2. Advanced Functional Materials, 23(14), 1798-1806. doi:10.1002adfm.201202256.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-0FA5-1
Abstract
There is no abstract available