Fabrication and characterization of semiconducting half-Heusler YPtSb thin films

Shan, R.; Vilanova, E. V.; Qin, J.; Casper, F.; Fecher, G. H.; Jakob, G.; Felser, C.

doi:10.1002/pssr.201206413

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Fabrication and characterization of semiconducting half-Heusler YPtSb thin films

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Fecher, G. H.
Gerhard Fecher, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Felser, C.
Claudia Felser, Inorganic Chemistry, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Shan, R., Vilanova, E. V., Qin, J., Casper, F., Fecher, G. H., Jakob, G., et al. (2013). Fabrication and characterization of semiconducting half-Heusler YPtSb thin films. Physica Status Solidi RRL, 7(1-2), 145-147. doi:10.1002/pssr.201206413.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-1F88-8

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