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Quantitative HAADF-STEM tomography of unsupported intermetallic Ga-Pd catalysts

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Armbrüster,  M.
Marc Armbrüster, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Leary, R., Saghi, Z., Armbrüster, M., Schlögl, R., Thomas, J. M., & Midgley, P. (2012). Quantitative HAADF-STEM tomography of unsupported intermetallic Ga-Pd catalysts. Journal of Physics: Conference Series, 371: 012024, pp. 012024-1-012024-4. doi:10.1088/1742-6596/371/1/012024.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-208F-F
Abstract
HAADF-STEM tomography has been used for characterisation of novel unsupported intermetallic Ga-Pd catalysts, with accompanying analysis by HRTEM and EDXS. Image processing techniques applied to the tomogram have facilitated segmentation and the subsequent extraction of size and shape parameters. The fidelity of the analysis has been critically examined, enabling identification of reconstruction artefacts and thereby more reliable determination of catalytically relevant properties. Further steps towards robust and accurate metrology by electron tomography are discussed.