TEM Characterisation of YNi2B2C Thin Film Microstructure

Cao, G. H.; Simon, P.; Skrotzki, W.; Wimbush, S. C.; Holzapfel, B.

doi:10.1007/s00339-004-2768-x

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TEM Characterisation of YNi₂B₂C Thin Film Microstructure

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Simon, P.
Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Citation

Cao, G. H., Simon, P., Skrotzki, W., Wimbush, S. C., & Holzapfel, B. (2005). TEM Characterisation of YNi₂B₂C Thin Film Microstructure. Applied Physics A, Supplement, 81(3), 583-585. doi:10.1007/s00339-004-2768-x.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0015-2C83-9

Abstract

A thin film of the superconductor YNi2B2C deposited on an MgO(001) substrate by pulsed laser deposition has been investigated by transmission electron microscopy (TEM). Plan-view TEM analyses show that the YNi2B2C film consists of isolated rectangular grains distributed within a second phase. This phase was identified as the monoclinic phase Y2Ni15B6 with lattice parameters a=1.422 nm,b=1.067 nm,c=0.958 nm and β=95°. Additionally, the cubic phase Y2O3 with lattice constant a=1.06 nm was identified within the film.