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Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi2B2C Thin Film

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Simon,  P.
Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Cao, G. H., Skrotzki, W., Simon, P., Wimbush, S. C., & Holzapfel, B. (2005). Transmission Electron Microscopy and High-Resolution Electron Microscopy Investigation of the Microstructure of an YNi2B2C Thin Film. Chemistry of Materials, 17, 3558-3562. doi:10.1021/cm050006t.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-2CC3-A
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