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Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO

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Simon,  P.
Paul Simon, Chemical Metal Science, Max Planck Institute for Chemical Physics of Solids, Max Planck Society;

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Cao, G. H., Simon, P., Krämer, U., Wimbush, S. C., & Holzapfel, B. (2004). Transmission Electron Microscopy and High-Resolution Electron Microscopy Study of YNi2B2C Thin Film on Y2O3-Buffered MgO. Chemistry of Materials, 16(5), 842-845. doi:10.1021/cm031044k.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0015-2F35-1
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